The National Institute of Standards and Technology (NIST), recently released an article examining the methods that can pull data from damaged mobile phones. The two methods the NIST researches use to extract the data of interest are called Chip-off and JTAG.
The Chip-off and JTAG methods of pulling data of a phones involve connecting directly to specific data chips on the circuit board. These methods may be useful when the device in question no longer powers on or damage to the data port has occurred.
The work being performed by NIST will advance the way digital forensic labs address future examinations by pinpointing the best tools for the job. By finding the most effective method to extract the data, time and money will ultimately be saved.
Digital forensic expert Rick Ayers commented on the study by saying “Many labs have an overwhelming workload, and some of these tools are very expensive. To be able to look at a report and say, this tool will work better than that one for a particular case — that can be big advantage.”
Additionally, NIST has JTAG and chip off reports available to view on the Department of Homeland Security website.
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Digital Forensics/Cybersecurity/Information Technology